Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

As a surface-sensitive technique, the diffraction signal comes from the top few nanometers of the crystal lattice in EBSD. Hence, the top layer needs to be devoid of oxidation, contamination and ...

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...

Two major challenges are faced during the analysis of pressed powdered dairy samples (infant formulas, cheese powder, whey powder, milk protein, whole and skimmed milk powder, etc.) using XRF ...